| Parameter | Value | Unit |
| V DS | 650 | V |
| I D, pulse | 96 | A |
| R DS(ON), max @ V GS =10V | 99 | mΩ |
| Q g | 66.6 | nC |
| Product Name | Package | Marking |
| OSG65R099HSZAF | TO247 | OSG65R099HSZA |
| Parameter | Symbol | Value | Unit |
| Drain-source voltage | V DS | 650 | V |
| Gate-source voltage | V GS | ±30 | V |
| Continuous drain current 1) , T C =25 °C |
I D |
32 |
A |
| Continuous drain current 1) , T C =100 °C | 20 | ||
| Pulsed drain current 2) , T C =25 °C | I D, pulse | 96 | A |
| Continuous diode forward current 1) , T C =25 °C | I S | 32 | A |
| Diode pulsed current 2) , T C =25 °C | I S, pulse | 96 | A |
| Power dissipation 3) , T C =25 °C | P D | 278 | W |
| Single pulsed avalanche energy 5) | E AS | 648 | mJ |
| MOSFET dv/dt ruggedness, V DS =0…480 V | dv/dt | 50 | V/ns |
| Reverse diode dv/dt, V DS =0…480 V, I SD ≤I D | dv/dt | 50 | V/ns |
| Operation and storage temperature | T stg , T j | -55 to 150 | °C |
| Parameter | Symbol | Value | Unit |
| Thermal resistance, junction- case | R θJC | 0.45 | °C/W |
| Thermal resistance, junction- ambient 4) | R θJA | 62 | °C/W |
| Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
| Drain-source breakdown voltage | BV DSS | 650 | V | V GS =0 V, I D =1 mA | ||
| Gate threshold voltage | V GS(th) | 3.0 | 4.5 | V | V DS =V GS , I D =1 mA | |
|
Drain-source on- state resistance |
R DS(ON) |
0.090 | 0.099 |
Ω |
V GS =10 V, I D =16 A | |
| 0.21 | V GS =10 V, I D =16 A, T j =150 °C | |||||
| Gate-source leakage current |
I GSS |
100 |
nA |
V GS =30 V | ||
| - 100 | V GS =-30 V | |||||
| Drain-source leakage current | I DSS | 10 | μA | V DS =650 V, V GS =0 V | ||
| Gate resistance | R G | 7.8 | Ω | ƒ=1 MHz, Open drain |
| Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
| Input capacitance | C iss | 3988 | pF |
V GS =0 V, V DS =50 V, ƒ=100 kHz |
||
| Output capacitance | C oss | 210 | pF | |||
| Reverse transfer capacitance | C rss | 7.4 | pF | |||
| Effective output capacitance, energy related | C o(er) | 124 | pF |
V GS =0 V, V DS =0 V-400 V |
||
| Effective output capacitance, time related | C o(tr) | 585 | pF | |||
| Turn-on delay time | t d(on) | 46.0 | ns |
V GS =10 V, V DS =400 V, R G =2 Ω, I D =20 A |
||
| Rise time | t r | 60.3 | ns | |||
| Turn-off delay time | t d(off) | 93.0 | ns | |||
| Fall time | t f | 3.7 | ns |
| Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
| Total gate charge | Q g | 66.6 | nC |
V GS =10 V, V DS =400 V, I D =20 A |
||
| Gate-source charge | Q gs | 20.6 | nC | |||
| Gate-drain charge | Q gd | 24.8 | nC | |||
| Gate plateau voltage | V plateau | 6.7 | V |
| Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
| Diode forward voltage | V SD | 1.3 | V | I S =32 A, V GS =0 V | ||
| Reverse recovery time | t rr | 151.7 | ns |
I S =20 A, di/dt=100 A/μs |
||
| Reverse recovery charge | Q rr | 1.0 | μC | |||
| Peak reverse recovery current | I rrm | 12.3 | A |